2002 Design, Automation, and Test in Europe Conference and Exhibition: Proceedings: March 4-8, 2002, Paris, France [DATE 02]

Kloos, Carlos Delgado; da Franca, Jose, eds.

ISBN 10: 0769514715 / ISBN 13: 9780769514710

Editore: IEEE Computer Society, Los Alamitos, Calif., 2002

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4to, paperback. As new condition. xlv, 1147 p. Codice articolo 1090916.14

Dati bibliografici

Titolo: 2002 Design, Automation, and Test in Europe ...

Casa editrice: IEEE Computer Society, Los Alamitos, Calif.

Data di pubblicazione: 2002

Legatura: Paperback

Condizione: As New

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Riassunto:

Proceedings of the March 2002 conference, bringing together academics, researchers, industry specialists, users, and vendors in the fields of design, automation, and test of electronic circuits and systems. The approximately 188 contributions offer information about the technical and architectural trends of circuits and systems, small and large, and the design automation and test challenges they bring to tool vendors, PCB companies, and semiconductor and IP providers. Among the topics: how to choose a semiconductor IP; formal verification of complex designs; cooling layout arrangements; defect oriented and advanced mixed signal tests; power analysis and management in networks and processors; IP business models; SAT and BDD techniques; technology and interconnect issues in low power design; and several "hot topics" such as EDA tools for RF, deep submicron design and timing closure, using UML for embedded system specification, and seamless top-down design methods for analogue and mixed signal application. There is no subject index. Annotation c. Book News, Inc., Portland, OR (booknews.com)