Particle Beam Physics: Volume 105 - Rilegato

Rilegato

ISBN 10: 0120147475 ISBN 13: 9780120147472

Casa editrice: Academic Pr, 1998

Riassunto

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics andAdvances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Su questo libro

Informazioni sull'autore

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Dettagli dell'edizione

• Editore: Academic Pr
• Data di pubblicazione: 1998
• Lingua: Inglese
• ISBN 10: 0120147475
• ISBN 13: 9780120147472
• Rilegatura: Copertina rigida
• Numero edizione: 1
• Numero di pagine: 416
• Redattore: Hawkes Peter W.
• Contatto del produttore: non disponibile
• Persona responsabile: LSWR Group; b.criscuolo@lswr.it; ; Via Spadolini, 7; Milano; Italia