Foundations of Measurement: Geometrical, Threshold, and Probabilistic Representations: Volume 2 - Rilegato

Suppes, Patrick; Krantz, David H.; Luce, R. Duncan; Tversky, Amos

 
9780124254022: Foundations of Measurement: Geometrical, Threshold, and Probabilistic Representations: Volume 2

Sinossi

Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.

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9780486453156: Foundations of Measurement: Geometrical, Threshold, and Probabilistic Representations

Edizione in evidenza

ISBN 10:  0486453154 ISBN 13:  9780486453156
Casa editrice: Dover Pubns, 2006
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