Physics of Thin Films: Optical Characterizations of Real Surfaces and Films: Advances in Research and Development: 19 - Rilegato

 
9780125330190: Physics of Thin Films: Optical Characterizations of Real Surfaces and Films: Advances in Research and Development: 19
Rilegato
ISBN 10: 0125330197 ISBN 13: 9780125330190
Casa editrice: Academic Pr, 1995

Sinossi

This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time andinsitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.

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Editore
Academic Pr
Data di pubblicazione
1995
Lingua
Inglese
ISBN 10 
0125330197
ISBN 13 
9780125330190
Rilegatura
Copertina rigida
Numero edizione
1
Numero di pagine
328
Redattore
Vedam K.
Contatto del produttore
non disponibile
Persona responsabile
non disponibile