Probability & Statistics for Engineers & Scientists: United States Edition - Rilegato

Walpole, Ronald E.; Myers, Raymond H.; Myers, Sharon L.; Ye, Keying

Rilegato

ISBN 10: 0131877119 ISBN 13: 9780131877115

Casa editrice: Pearson College Div, 2006

Riassunto

With its unique balance of theory and methodology, this classic text provides a rigorous introduction to basic probability theory and statistical inference, motivated by interesting, relevant applications. Offers extensively updated coverage, new problem sets, and chapter-ending material to enhance the book’s relevance to today’s engineers and scientists. Includes new problem sets demonstrating updated applications to engineering as well as biological, physical, and computer science. Emphasizes key ideas as well as the risks and hazards associated with practical application of the material. Includes new material on topics including: difference between discrete and continuous measurements; binary data; quartiles; importance of experimental design; “dummy” variables; rules for expectations and variances of linear functions; Poisson distribution; Weibull and lognormal distributions;  central limit theorem, and data plotting. Introduces Bayesian statistics, including its applications to many fields.

For those interested in learning more about probability and statistics.

 

Su questo libro

Informazioni sull?autore

Raymond H Myers is currently Professor Emeritus of statistics at Virginia Tech. He received his Masters and Ph.D. from Virginia Tech in statistics and his BS in chemical engineering. His major areas of interest are linear models, design of experiments, and response surface methodology. He has authored or co-authored six statistics texts that were published in fifteen separate editions and in several foreign languages.

He has received numerous teaching awards and in 1985 he was selected “Professor of the Year” in the state of Virginia by the Council on the Advancement and Support of Education. He was elected Fellow of ASA in 1974. In 1999 he was given the Shewhart Award for lifetime contributions in statistics and quality control by the American Society of Quality.

 

 

Sharon L Myers is currently Professor Emeritus of mathematics and statistics at Radford University. She received her MS in statistics from Virginia Tech. Her areas  of interest are statistical computing, regression analysis, and response surface methodology. She has co-authored three editions of “Probability & Statistics for Engineers & Scientists”. She was the assistant director of the statistical consulting center at Virginia Tech for 15 years and the director of the statistical consulting center at Radford University for 7 years.

 

Keying Ye, University of Texas at San Antonio

Dettagli dell?edizione

• Editore: Pearson College Div
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 0131877119
• ISBN 13: 9780131877115
• Rilegatura: Copertina rigida
• Numero di pagine: 816
• Contatto del produttore: non disponibile