Articoli correlati a Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy - Rilegato

Chen, C. Julian

 
9780195071504: Introduction to Scanning Tunneling Microscopy
Rilegato
ISBN 10: 0195071506 ISBN 13: 9780195071504
Casa editrice: Oxford Univ Pr on Demand, 1993

Sinossi

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

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Product Description

Book by Chen C Julian

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Oxford Univ Pr on Demand
Data di pubblicazione
1993
Lingua
Inglese
ISBN 10 
0195071506
ISBN 13 
9780195071504
Rilegatura
Copertina rigida
Numero di pagine
472
Contatto del produttore
Messaggerie Libri
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