Scanning and Transmission Electron Microscopy: An Introduction - Rilegato

Flegler, Stanley L.; Heckman, John W., Jr.; Klomparens, Karen L.

Rilegato

ISBN 10: 0195107519 ISBN 13: 9780195107517

Casa editrice: Oxford Univ Pr on Demand, 1993

Riassunto

This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

Su questo libro

Informazioni sull'autore

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Dettagli dell'edizione

• Editore: Oxford Univ Pr on Demand
• Data di pubblicazione: 1993
• Lingua: Inglese
• ISBN 10: 0195107519
• ISBN 13: 9780195107517
• Rilegatura: Copertina rigida
• Numero di pagine: 225
• Contatto del produttore: non disponibile
• Persona responsabile: Ufficio Anagrafiche Messaggerie; ufficio.anagrafiche@meli.it; ; Via Verdi, 8; Assago Milano; 20090; Italia