Defect and Microstructure Analysis by Diffraction: 10 - Rilegato

Rilegato

ISBN 10: 0198501897 ISBN 13: 9780198501893

Casa editrice: OUP Oxford, 2000

Riassunto

Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.

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Recensione

'This book reviews the state of the art for determining the "real" structure of matter' Zeitschrift Fur kristallographie

Contenuti

• Fiala and Snyder: Introduction to Defect and Microstructure Analysis or the Analysis of Real-Structure
• Bradaczek: Some Applications of the Kinematical Theory of X-ray Diffraction
• Enzo and Schiffini: Profile Fitting and Analytical Functions
• Honkimäki and Suortti: Effects of Instrument Function, Crystallite Size, and Strain on Reflection Profiles
• Langford: Use of Pattern Decomposition or Simulation to Study Microstructure: theoretical considerations
• Houska and Kuzel: Classical Treatment of Line Profiles Influenced by Strain, Small Size, and Stacking Faults
• Balzar: Voigt-Function Model in Diffraction Line-Broadening Analysis
• Barabash: X-Ray Analysis of Precipitation Related Crystals with Dislocation Substructure
• Ungár: The Dislocation Based Model of Strain Broadening in X-Ray Line-Profile Analysis
• Vermeulen et al: Diffraction-Line Broadening Analysis of Dislocation Configurations
• Berkum et al: Diffraction-Line Broadening Analysis of Strain Fields in Crystalline Solids
• Bradaczek: Paracrystallinity
• Wilke: The Model of the Paracrystal and its Application to Polymers
• Ustinov: Effect of Planar Defects in Crystal on the Position and Profile of Powder Diffraction Line
• Weiss and Capková: Effect of Stacking Disorder on the Profile of the Powder Diffraction Line
• Smith: Crystallite Statistics and Accuracy in Powder Diffraction Intensity Measurements
• Fewster and Andrew: Reciprocal Space Mapping and Ultra-High Resolution Diffraction of Polycrystalline Materials
• Ganev: X-Ray Analysis of The Inhomogeneous Stress State
• Bunge: Texture Analysis
• Valvoda: Texture Effects in Powder Diffraction and their Correction by Simple Empirical Functions
• Le Bail: Accounting For Size and Microstrain in Whole Powder Pattern Fitting
• Järvinen: Modelling of Texture in Whole Pattern Fitting
• Scardi: A New Whole Powder Pattern Fitting Approach
• Smith: The Role of Whole-Pattern Databases in Materials Science
• Cernansky: Restoration and Preprocessing of Physical Profiles from Measured Data
• Reefman: Towards Higher Resolution: A Mathematical Approach
• Louër: Use of Pattern Decomposition to Study Microstructure: Practical Aspects and Applications
• Kimmel and Dayan: X-Ray Diffraction Broadening Effects in Materials Characterization
• Somashekar: Crystal Size and Distortion Parameters in Fibres using WAXS
• Yamanaka: Pressure Induced Profile Change of Energy Dispersive Diffraction

Dettagli dell'edizione

• Editore: OUP Oxford
• Data di pubblicazione: 2000
• Lingua: Inglese
• ISBN 10: 0198501897
• ISBN 13: 9780198501893
• Rilegatura: Copertina rigida
• Numero di pagine: 808
• Redattore: Snyder Robert, Fiala Jaroslav, Bunge Hans J
• Contatto del produttore: Messaggerie Libri; ufficio.anagrafiche@meli.it; ; Via Verdi, 8.; Assago Milano; 20090; Italia