Atom Probe Field Ion Microscopy: 52 - Rilegato

Miller, M. K.; Cerezo, A.; Hetherington, M. G.; Smith FRS, G. D. W.

Rilegato

ISBN 10: 0198513879 ISBN 13: 9780198513872

Casa editrice: OUP Oxford, 1996

Riassunto

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Su questo libro

Informazioni sull'autore

Hetherington - deceased

Dettagli dell'edizione

• Editore: OUP Oxford
• Data di pubblicazione: 1996
• Lingua: Inglese
• ISBN 10: 0198513879
• ISBN 13: 9780198513872
• Rilegatura: Copertina rigida
• Numero di pagine: 520
• Contatto del produttore: non disponibile
• Persona responsabile: Penguin Random House Ireland Limited; productsafety@penguin.co.uk; ; Morrison Chambers, 32 Nassau Street; Dublin; Irlanda