Role Microscopy In Semiconductor Failure Analysis - Brossura

Richards, B. P.; Footner, P. K.

Brossura

ISBN 10: 0198564325 ISBN 13: 9780198564324

Casa editrice: CRC Press, 1992

Riassunto

Microscopy is central to the vast majority of semiconductor failure analyses, and is therefore of great importance to engineers concerned with design validation, process optimization, component qualification, testing, and pre- or post-use diagnostics. A wide range of microscopical techniques is available, and each has a unique and complementary role to play in determining the causes of semiconductor failure. The applications of microscopy to semiconductor failure analysis are described in this concise handbook, which provides a valuable practical guide for all those working in the field. The basic principles and operation of each type of microscopy are explained, and each is illustrated with case histories and micrographs of many failure mechanisms. The need for new microscopies for the study of future generation devices is discussed, and several possible candidates for this purpose are assessed.

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Product Description

Book by Richards B P Footner P K

Dettagli dell'edizione

• Editore: CRC Press
• Data di pubblicazione: 1992
• Lingua: Inglese
• ISBN 10: 0198564325
• ISBN 13: 9780198564324
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 114
• Contatto del produttore: non disponibile
• Persona responsabile: Ufficio Anagrafiche Messaggerie; ufficio.anagrafiche@meli.it; ; Via Verdi, 8; Assago Milano; 20090; Italia