Advances in X-Ray Analysis: Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6–8, 1969: Volume 13 - Rilegato

Rilegato

ISBN 10: 0306381133 ISBN 13: 9780306381133

Casa editrice: Kluwer Academic/Plenum Publishers, 1970

Riassunto

This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers in the application of low energy x-ray and the associated photo-Auger electron interactions. These include A. K. Baird and W. L. Baun on Light Element Analysis and Long Wavelength Instrumentation; J. E. Hollid~, D. W. Fischer, R. J. Liefeld and D. J. Nagel on Bonding and Valence State; H. Friedman and W. P. Reidy on X-R~ Astronomy; and R. Nordberg on Photo-Auger Electron Spectroscopy. Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy. It has been most appropriate and indeed a privilege to have Dr. Herbert Friedman as a speaker and contributor to this volume.

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Contenuti

An Introduction to Low Energy X-Ray and Electron Analysis.- Light Element Analysis.- Detection and Spectroscopy of Long Wavelength X-Rays.- Quantitative X-Ray Fluorescence Analysis with Variable Take-Off Angle.- Evaluation of Soft and Hard Scattered X-Rays as an Internal Standard for Light Element Analysis.- An Improved X-Ray Fluorescence Method for the Analysis of Museum Objects.- On-Stream Analysis of Liquid Samples Containing Elements of High and Low Atomic Number by X-Ray Fluorescence with Air and Vacuum Spectrograph.- Simultaneous X-Ray Emission Analysis of P, Si, Ca, Fe, Al, and Mg in Phosphate Rock Using a Small Computer to Correct for Matrix Variations.- Soft X-Ray Valence State Effects in Conductors.- Chemical Bonding and Valence State—Nonmetals.- Interpretation of Valence Band X-Ray Spectra.- A Vacuum Spectrometer for Studying the Chemical Effect on Soft X-Ray Spectra.- Point Scattering Theory of X-Ray K-Absorption Fine Structure.- A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies.- X-Ray Astronomy.- X-Ray Instrumentation for Space Experiments.- System for Non-Dispersive Analysis of Lunar X-Rays from Apollo.- Development of a Slitless Spectrograph for X-Ray Astronomy.- X-Ray Interaction Coefficients: Effect on Interpretation of Solar X-Ray Data.- X-Ray Spectrometry Properties of Potassium Acid Phthalate Crystals.- Grating Studies at X-Ray Wavelengths.- Electron Spectroscopy for Studying Chemical Bonding.- IEE — A New Type of X-Ray Photoelectron Spectrometer.- ?-Excited Auger Spectra.- The Application of X-Ray Data to the Determination of Atomic Energy Levels.- On the Symmetry of Orientation Distribution in Crystal Aggregates.- Automated Lattice Parameter Determination on Single Crystals.- Correlation of Residual Stress Level and Fatigue Damage in B. C. C. Metals.- Application of the X-Ray Two-Exposure Stress Measuring Technique to a Carburized Steel.- X-Ray Diffraction from Vibrating Quartz Plates.- X-Ray Topographic Study of Vibrating Dislocations in Ice under an AC Electric Field.- An Approach to the Solid Solution Problem Using a Computerized Identification Technique.- A Versatile Bragg-Brentano/Seeman-Bohlin Powder Diffractometer.- Measurement of Long Range Order in ?’ Phase of Nickel-Base Superalloys.- Measurement of the Molecular Size of a Sodium Humate Fraction.- A New Absolute-Scale Small-Angle X-Ray Scattering Instrument.- Mass Absorption Coefficient Measurements Using Thin Films.- X-Ray Absorption Tables for the 2-to-200 a Region.- Author Index.

Dettagli dell?edizione

• Editore: Kluwer Academic/Plenum Publishers
• Data di pubblicazione: 1970
• Lingua: Inglese
• ISBN 10: 0306381133
• ISBN 13: 9780306381133
• Rilegatura: Copertina rigida
• Numero edizione: 1
• Numero di pagine: 694
• Redattore: Henke Burton L.
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania