Defect and Fault Tolerance in VLSI Systems: Volume 2 - Rilegato

Rilegato

ISBN 10: 0306435314 ISBN 13: 9780306435317

Casa editrice: Springer-Verlag GmbH, 1990

Riassunto

Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

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Contenuti

1 Models for VLSI Manufacturing Yield.- Fault-Free or Fault-Tolerant VLSI Manufacturing.- Yield Models ― Comparative Study.- 2 Models for Defects and Yield.- A Unified Approach to Yield Analysis of Defect Tolerant Circuits.- Systematic Extraction of Critical Areas From IC Layouts.- The Effect on Yield of Clustering and Radial Variations in Defect Density.- 3 Implementation of Wafer Scale Integration.- Practical Experiences in the Design of a Wafer Scale 2-D Array.- Yield Evaluation of a Soft-Configurable WSI Switch Network.- ASP Modules: WSI Building-Blocks for Cost-Effective Parallel Computing.- 4 Fault Tolerance.- Fault-Tolerant k-out-of-n Logic Unit Network With Minimum Interconnection.- Extended Duplex Fault Tolerant System With Integrated Control Flow Checking.- Experience in Functional Test and Fault Coverage in a Silicon Compiler.- 5 Array Processors.- APES: An Evaluation Environment of Fault-Tolerance Capabilities of Array Processors.- Comparison of Reconfiguration Schemes for Defect Tolerant Mesh Arrays.- An Integer Linear Programming Approach to General Fault Covering Problems.- Probabilistic Analysis of Memory Repair and Reconfiguration Heuristics.- Arithmetic-Based Diagnostics in VLSI Array Processors.- 6 New Approaches and Issues.- Yield Improvement Through X-RAY Lithography.- Reliability Analysis of Application-Specific Architectures.- Fault Tolerance in Analog VLSI: Case Study of a Focal Plane Processor.- 7 Yield and Manufacturing Defects.- Yield Model With Critical Geometry Analysis for Yield Projection from Test Sites on a Wafer Basis With Confidence Limits.- SRAM/TEG Yield Methodology.- A Fault Detection and Tolerance Tradeoff Evaluation Methodology for VLSI Systems.- 8 Designs for Wafer Scale Integration.- A Hypercube Design on WSI.- An Efficient Reconfiguration Scheme for WSI of Cube-Connected Cycles With Bounded Channel Width.- A Communication Scheme for Defect Tolerant Arrays.

Product Description

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Dettagli dell'edizione

• Editore: Springer-Verlag GmbH
• Data di pubblicazione: 1990
• Lingua: Inglese
• ISBN 10: 0306435314
• ISBN 13: 9780306435317
• Rilegatura: Copertina rigida
• Numero di pagine: 334
• Redattore: Stapper C. H., Saucier Gabriele, Jain V. K.
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania