Articoli correlati a X-Ray Spectrometry in Electron Beam Instruments

X-Ray Spectrometry in Electron Beam Instruments - Rilegato

 
9780306448584: X-Ray Spectrometry in Electron Beam Instruments

Sinossi

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly.

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Recensione

`[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.'
from the Foreword by Peter Duncumb, University of Cambridge, England
`Contains a vast amount of detailed information and will surely be heavily used.'
Ultramicroscopy

Contenuti

The Development of Energy Dispersive Electron Probe Analysis; K.F.J. Heinrich. Problems and Trends in X-ray Detector Design for Microanalysis; B.G. Lowe. New Materials for Thin Windows; M.W. Lund. Intrinsic Ge Detectors; R. Sareen. Modeling the Energy-dispersive X-ray Detector; D.C. Joy. The Effect of Detector Dead Layers on Light Element Detection; J.J. McCarthy. Energy-dispersive X-ray Spectrometry in Ultra-high Vacuum Environments; J.R. Michael. Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis; P.J. Statham. Improving EDS Performance with Digital Pulse Processing; R.B. Mott, J.J. Friel. A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra; C.R. Swyt. Artifacts in Energy-dispersive X-ray Spectrometry in Electron Beam Instruments: Are Things Getting Any Better?; D.E. Newbury. Characterizing an Energy-dispersive Spectrometer on an Analytical Electron Microscope; S.M. Zemyan, D.B. Williams. Wavelength Dispersive Spectrometry - A Review; S.J.B. Reed. Synthetic Multilayer Crystals for EPMA of Ultralight Elements; G.F. Bastin, H.J.M. Heijligers. 4 additional articles. Index.

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Altre edizioni note dello stesso titolo

9781461357384: X-Ray Spectrometry in Electron Beam Instruments

Edizione in evidenza

ISBN 10:  1461357381 ISBN 13:  9781461357384
Casa editrice: Springer, 2012
Brossura