Statistical Regression With Measurement Error: No. 6 - Rilegato

Cheng, Chi-Lun; Van Ness, John W.

Rilegato

ISBN 10: 0340614617 ISBN 13: 9780340614617

Casa editrice: John Wiley & Sons Inc, 1999

Riassunto

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the style of the Kendall and StuartAdvanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Su questo libro

Dalla quarta di copertina

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Dettagli dell?edizione

• Editore: John Wiley & Sons Inc
• Data di pubblicazione: 1999
• Lingua: Inglese
• ISBN 10: 0340614617
• ISBN 13: 9780340614617
• Rilegatura: Copertina rigida
• Numero di pagine: 256
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile