Articoli correlati a Electron and Ion Microscopy and Microanalysis: Principles...

Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, - Brossura

Libro 77 di 98: Optical Science and Engineering
 
9780367402945: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Brossura
ISBN 10: 0367402947 ISBN 13: 9780367402945
Casa editrice: CRC Press, 2019

Sinossi

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sull'autore

Lawrence E. Murr

Dalla quarta di copertina

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
CRC Press
Data di pubblicazione
2019
Lingua
Inglese
ISBN 10 
0367402947
ISBN 13 
9780367402945
Rilegatura
Copertina flessibile
Numero edizione
2
Numero di pagine
856
Redattore
Murr Lawrence E
Contatto del produttore
Taylor and Francis, GPSR Taylor and Francis
gpsr@taylorandfrancis.com

Taylor & Francis Verlag GmbH, Kaufingerstraße 24
München
80331
Germania