Statistical Methods for SPC and TQM: 26 - Rilegato

Bissell, D

Rilegato

ISBN 10: 0412394405 ISBN 13: 9780412394409

Casa editrice: Chapman and Hall/CRC, 1994

Riassunto

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

Su questo libro

Informazioni sull?autore

D Bissell

Dettagli dell?edizione

• Editore: Chapman and Hall/CRC
• Data di pubblicazione: 1994
• ISBN 10: 0412394405
• ISBN 13: 9780412394409
• Rilegatura: Copertina rigida
• Lingua: Inglese
• Numero edizione: 1
• Numero di pagine: 386
• Redattore: Lindsey Jim, Zidek Jim, Chatfield Chris
• Contatto del produttore: non disponibile