Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces.
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`The book is a landmark in mapping the present status of a broad field, the essential unity of which was obscured until this collection of essays pointed it out. Materials interfaces will be a standard reference for some time to come.'
Euro Materials
Contributors. Introduction. Atomic-level geometry of crystalline interfaces; D. Wolf. Experimental investigation of internal interfaces in solids; D.N. Seidman. Bulk interfaces. Part I: Bulk interfaces. Correlation between the structure and energy of grain boundaries in metals; D. Wolf, K.L. Merkle. Grain and interphase boundaries in ceramics and ceramic composites; M.G. Norton, C.B. Carter. Special properties of E grain boundaries; G. Palumbo, K.T. Aust. Grain boundary structure and migration; D.A. Smith. Role of interfaces in melting and solid-state amorphization; S.R. Phillpot, S. Yip, P.R. Okamoto, D. Wolf. Wetting of surfaces and grain boundaries; D.R. Clarke, M. Gee. Part II: Semi-bulk and thin-film interfaces. Structural, electronic and magnetic properties of thin films and superlattices; A. Continenza, C.Li, A.J. Freeman. Surfaces and interfaces as studied by scanning-tunneling microscopy; R. Hamers. Epitaxy of semiconductor thin films; J. Batstone. Phase behavior of monolayers; S.G.J. Mochrie, D. Gibbs, D.M. Zehner. Elastic and structural properties of superlattices; M. Grimsditch, I.K. Schuller. Computer simulation of the elastic behavior of interface materials; D. Wolf, J. Jasczak. Interfaces within intercalation compounds; M.S. Dresselhaus, G. Dresselhaus. Nanophase materials: structure-property correlations; R.W. Siegel. Part III: Role of interface chemistry. Interfacial segregation, bonding and reactions; C.L. Briant. Physics and chemistry of segregation at internal interfaces; R. Kirchheim. Atomic resolution study of solute-atom segregation at grain boundaries: experiments and Monte Carlo simulations; S.M. Foiles, D. Seidman. Amorphization by interfacial reaction; W.L. Johnson. Relationship between structural and electronic properties of metal-semiconductor interfaces; R. Tung. Electronic properties of semiconductor-semiconductor interfaces and their control using interface chemistry; D.W. Niles, G. Margaritondo. Microscopic nature of metal-polymer interfaces; P.S. Ho, B.D. Silverman, S-L. Chiu. Part IV: Fracture behavior. Tensile strength of interfaces; A.S. Argon, V. Gupta. Microstructure and fracture resistance of metal/ceramic interfaces; A.G. Evans, M. Ruhle. Role of interface dislocations and surface ledges in the work of adhesion; D. Wolf, J. Jaszczak. Microstructural and segregation effects in the fracture of polycrystals; D.J. Srolovitz, W. Yang.
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Da: Chamblin Bookmine, Jacksonville, FL, U.S.A.
4to Hardcover. Condizione: Very Good. 1st. 716pp. Contents are unmarked on white pages. Binding is tight with secure hinges. Boards are clean and pointed with minor shelf wear. Supplements not included. Codice articolo 101279
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Condizione: Good. Good++; Hardcover; Covers are still glossy with a few light handling-marks; Clean textblock edges; Name inside the front cover; The endpapers and all text pages are clean and unmarked; The binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium-Large Format (Quatro, 9.75" - 10.75" tall); 3.1 lbs; Blue and black covers with title in white lettering; 1992, Springer-Verlag Publishing; 736 pages; "Materials Interfaces: Atomic-level Structure and Properties," by D. Wolf & Sidney Yip. Codice articolo SKU-0673AE03903014
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Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 740 | Sprache: Englisch | Produktart: Bücher | Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces. Codice articolo 3026286/202
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in thi. Codice articolo 5914639
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Buch. Condizione: Neu. Materials Interfaces | Atomic-level Structure and Properties | Sidney Yip (u. a.) | Buch | xviii | Englisch | 1992 | Springer Netherland | EAN 9780412412707 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Codice articolo 102552750
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces. 740 pp. Englisch. Codice articolo 9780412412707
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Buch. Condizione: Neu. Neuware -Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 740 pp. Englisch. Codice articolo 9780412412707
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Condizione: New. Many of the important properties of materials in high-technology applications are influenced or even controlled by the presence of solid interfaces. This work reviews the range of subjects in this field focusing on the atomic level properties of solid interfaces. Editor(s): Wolf, Dieter H.; Yip, Sidney. Num Pages: 734 pages, biography. BIC Classification: TGM. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 279 x 210 x 39. Weight in Grams: 1488. . 1992. Hardback. . . . . Codice articolo V9780412412707
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