Fundamentals of Microstructural Characterization of Materials - Brossura

Garmestani

Brossura

ISBN 10: 0443341893 ISBN 13: 9780443341892

Casa editrice: Elsevier, 2025

Riassunto

Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching. Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.

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Informazioni sugli autori

Dr. Hamid Garmestani is a Professor in the School of Materials Science and Engineering at the Georgia Institute of Technology and a fellow of ASM International and American Society of Mechanical Engineering (ASME). His main research and teaching interests focus on the relationships between microstructure and properties in textured polycrystalline materials, composites, superplastic, magnetic, and thin film layered structures. He employs models based on phenomenological and statistical mechanics within a computational framework to study the evolution of microstructure and texture (micro-texture) during fabrication processes and to forecast their effective properties, including mechanical, transport, and magnetic characteristics. Presently he is focused on modeling of processing and manufacturing processes specifically 3D manufacturing.

Navid Nasajpour-Esfahani is a Ph.D. candidate distinguished by his extensive expertise in nanotechnology, materials science, and fluid mechanics. His research spans a broad spectrum of critical topics, such as the modeling and simulation of heat transfer processes, exploration of the mechanical properties of nanomaterials, and the advancement of sophisticated numerical methods to simulate complex fluid dynamics. His current focus is on assessing residual stress in additive manufacturing, aiming to enhance the quality and performance of 3D printed materials.

Dalla quarta di copertina

Fundamentals of Microstructure Characterization of Materials covers a wide range of topics, methods, and fundamental information for the characterization of materials. Techniques discussed include spectroscopic ones such as electromagnetic radiation, X-ray photoelectron, atomic emission, and more. Scanning electron microscope techniques are outlined, as are sample preparation methods such as cutting, grinding and polishing, etching, and others. Microscopy fundamentals are discussed as well, with coverage of types of lenses, optical imaging formation principles, depth of field and depth of focus included. A full chapter is dedicated to statistical analysis, covering concepts such as cumulative distribution function, probability density function, and Gaussian distribution. X-ray diffraction and its application in phase analysis of materials is discussed as well.

Dettagli dell'edizione

• Editore: Elsevier
• Data di pubblicazione: 2025
• Lingua: Inglese
• ISBN 10: 0443341893
• ISBN 13: 9780443341892
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 518
• Contatto del produttore: non disponibile
• Persona responsabile: LSWR Group; b.criscuolo@lswr.it; ; Via Spadolini, 7; Milano; Italia