Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications - Rilegato

Haugstad, Greg

Rilegato

ISBN 10: 0470638826 ISBN 13: 9780470638828

Casa editrice: John Wiley & Sons Inc, 2012

Riassunto

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

&;Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com&;

Su questo libro

Informazioni sull?autore

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.

Dalla quarta di copertina

Complete guidance for becoming an expert user of atomic force microscopy and understanding its research applications

Although atomic force microscopy (AFM) is an essential tool in materials and biological research, little systematic training is available for users. Addressing the gap in the field, Atomic Force Microscopy is a comprehensive primer covering knowledge readers need in order to become astute operators of AFM, including basic principles, data analysis, and such applications as imaging, materials property characterization, in-liquid interfacial analysis, tribology (friction/wear), electrostatics, and more.

Geared to a wide audience, from students and technicians to research scientists and engineers, this unique guide explains in simple terms the distance-dependent intersurface forces AFM users need to understand when measuring basic surface properties. Moving gradually to more complex areas, it explores such topics as calibration, physical origins of artifacts, and multifrequency methods. Features include:

• Emphasis on core methods available on most research-grade commercial systems including ancillary modes such as lateral force probes or interleave-based scanning
• Clarification of essential concepts needed for using dynamic AFM and examining phase images
• Examples of simple yet useful custom methods to enable shear modulation and setpoint ramping
• A companion website containing real AFM data files and theoretical constructs for analyzing data

Readers will learn to configure and operate instruments and interpret results for successful applications of atomic force microscopy. They will also gain a thorough understanding of a variety of topics for future research and experimentation.

Dettagli dell'edizione

• Editore: John Wiley & Sons Inc
• Data di pubblicazione: 2012
• Lingua: Inglese
• ISBN 10: 0470638826
• ISBN 13: 9780470638828
• Rilegatura: Copertina rigida
• Numero di pagine: 464
• Contatto del produttore: WROX; https://www.wiley.com/en-us; ; 111 River Street; Hoboken; NJ; 7030; U.S.A.
• Persona responsabile: non disponibile