Regression analysis provides a conceptually simple method for investigating relationships among variables. Carrying out a successful application of regression analysis, however, requires a balance of theoretical results, empirical rules, and subjective judgement. Regression Analysis by Example, Third Edition explains the principles underlying exploratory data analysis, emphasizing data analysis rather than statistical theory. This is not just another edition of the book; it is a major rewriting and reorganization of the previous edition. The new edition is expanded and updated to reflect recent advances in the field, offering in-depth treatment of diagnostic plots, time series regression, multicollinearity, and logistic regression.
Suitable for anyone with an understanding of elementary statistics, Regression Analysis by Example, Third Edition illustrates methods of regression analysis, with examples containing the types of irregularities commonly encountered in the real world. Each example isolates one or two techniques and features detailed discussions of the techniques themselves, the required assumptions, and the evaluated success of each technique. Each of the methods described can be carried out with most currently available statistical software packages.
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A variety of ideas and methods of regression analysis are explored with the aid of realistic examples that highlight the analysis of data and include irregularities similar to those encountered in practice. Recent advances in regression diagnostics are covered with emphasis on plots such as component plus residual, added variable, sequence, along with index plots for leverage and function. The authors utilize standard and some not so standard summary statistics on the basis of their intuitive appeal to demonstrate concepts. The majority of analyses described are available in software packages on the market today.About the Author:
SAMPRIT CHATTERJEE, PhD, is Professor of Statistics at New York University. A well-known research scientist and Fulbright scholar, Dr. Chatterjee has coauthored Sensitivity Analysis in Linear Regression (with Dr. Hadi) and A Casebook for a First Course in Statistics and Data Analysis, both available from Wiley. ALI S. HADI, PhD, is the Stephen H. Weiss Presidential Fellow and Professor of Statistical and Computing Sciences at Cornell University. The author/coauthor of three other books, Dr. Hadi is a Fellow of the American Statistical Association and an elected member of the International Statistical Institute. BERTRAM PRICE, PhD, is President of Price Associates, a consulting firm in Washington D.C. Dr. Price's experience spans both academia and business, including work as a business scientist at IBM, and he has served as an associate editor of The American Statistician.
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Descrizione libro Wiley-Interscience, 1999. Hardcover. Condizione libro: New. 3. Codice libro della libreria DADAX0471319465
Descrizione libro Wiley-Interscience, 1999. Hardcover. Condizione libro: New. Never used!. Codice libro della libreria P110471319465
Descrizione libro Hoboken, New Jersey, U.S.A.: Wiley-Interscience, 1999. Hardcover. Condizione libro: New. Ship out 1-2 business day,Brand new,US edition, Free tracking number usually 2-4 biz days delivery to worldwide Same shipping fee with US, Canada,Europe country, Australia, item will ship out from either LA or Asia,h. Codice libro della libreria ABE-7185488788