Box on Quality and Discovery: With Design, Control, and Robustness - Rilegato

Box, George E. P.; Tiao, George C.; Bisgaard, Sren

Rilegato

ISBN 10: 0471387681 ISBN 13: 9780471387688

Casa editrice: Wiley-Interscience, 2000

Riassunto

A collection of masterworks on quality technology from the giant in the fiel

The chapters of this book are from the recent writings of George E. P. Box, an acknowledged world leader in the application and theory of quality methodology to management, process improvement, process design, and discovery

Box?s unique ability to explain complex ideas simply and appealingly with wit and cogent illustration is well known. It draws on profound knowledge and extensive industrial experience. In the past, these abilities have led to the creation of such techniques as response surface methods, time series analysis for forecasting and control, evolutionary operation, and applied Bayesian methods

Over the past fifteen years, Box?s work with many distinguished colleagues has been directed to the development and better understanding of quality techniques and how they can drive creativity and discovery. Key features of Box on Quality and Discovery include

• Five separate sections on (I) management issues, (II) experimental design, (III) sequential investigation for discovery, (IV) process control for monitoring and feedback adjustment, and (V) reduction of variation and design of robust products and processe
• Edited by five eminent quality practitioners and statisticians from industry and academi
• Superb subject and author index for easy referenc
• An additional key contribution from Stu Hunter

Published in celebration of George Box?s 80th birthday, this incomparable volume is destined to remain the definitive reference on statistical quality for many years to come

Su questo libro

Informazioni sull?autore

GEORGE C. TIAO, PhD, is Professor of Statistics at the University of Chicago. SØREN BISGAARD, PhD, is Professor at the University of St. Gallen in Switzerland. WILLIAM J. HILL, PhD, is Fellow at Honeywell International Inc., Buffalo, New York. DANIEL PEÑA, PhD, is Professor of Statistics and Econometrics, University Carlos III, Madrid. STEPHEN M. STIGLER, PhD, is Professor of Statistics at the University of Chicago.

Dettagli dell'edizione

• Editore: Wiley-Interscience
• Data di pubblicazione: 2000
• Lingua: Inglese
• ISBN 10: 0471387681
• ISBN 13: 9780471387688
• Rilegatura: Copertina rigida
• Numero di pagine: 599
• Redattore: Bisgaard Sren, Hill William J., Pena Daniel, Stigler Stephen M.
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile