Articoli correlati a Scanning Electron Microscopy and X-ray Microanalysis

Scanning Electron Microscopy and X-ray Microanalysis - Rilegato

Lawes, Graham

 
9780471913900: Scanning Electron Microscopy and X-ray Microanalysis

Sinossi

Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis. Mathematics are kept to a minimum with the emphasis on developing an understanding of the practical aspects of the techniques. The use of self-assessment questions to reinforce the learning process is particularly valuable.

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9780471913917: Scanning Electron Microscopy and X-ray Microanalysis

Edizione in evidenza

ISBN 10:  047191391X ISBN 13:  9780471913917
Casa editrice: John Wiley & Sons Ltd, 1987
Brossura