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This book was the first to be devoted to the compact modeling of RF power FETs.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
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Review of the hardback: '... a well-written and useful text ... a coherent review of the advanced state of power FET modelling and characterisation.' IEEE Microwave Magazine
Descrizione del libro
This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
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Modeling and Characterization of RF and Microwave Power Fets
Editore:
Cambridge University Press, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Da: moluna, Greven, Germania
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Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.Inhaltsver. Codice articolo 446932254
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Modeling and Characterization of RF and Microwave Power FETs
Editore:
Cambridge University Press, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Paperback
Da: Revaluation Books, Exeter, Regno Unito
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Paperback. Condizione: Brand New. 1st edition. 378 pages. 9.50x6.70x0.90 inches. In Stock. This item is printed on demand. Codice articolo __0521336171
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Modeling and Characterization of RF and Microwave Power FETs
Editore:
Cambridge University Press, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Paperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 640. Codice articolo C9780521336178
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Modeling and Characterization of RF and Microwave Power FETs (The Cambridge RF and Microwave Engineering Series)
Da: Ria Christie Collections, Uxbridge, Regno Unito
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Condizione: New. In. Codice articolo ria9780521336178_new
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Modeling and Characterization of RF and Microwave Power Fets
Editore:
Cambridge University Press, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Taschenbuch
Da: AHA-BUCH GmbH, Einbeck, Germania
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This 2007 book was the first to be devoted to the compact modeling of RF power FETs. Codice articolo 9780521336178
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Modeling and Characterization of Rf and Microwave Power Fets (The Cambridge RF and Microwave Engineering Series)
Editore:
Cambridge University Press 2011-06-30, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Paperback
Da: Chiron Media, Wallingford, Regno Unito
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Paperback. Condizione: New. Codice articolo 6666-IUK-9780521336178
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Modeling and Characterization of RF and Microwave Power FETs (Paperback)
Editore:
Cambridge University Press, Cambridge, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Paperback
Da: CitiRetail, Stevenage, Regno Unito
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Paperback. Condizione: new. Paperback. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Codice articolo 9780521336178
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Modeling and Characterization of RF and Microwave Power FETs (The Cambridge RF and Microwave Engineering Series)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
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Condizione: New. Codice articolo ABLIING23Feb2215580249913
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Modeling and Characterization of RF and Microwave Power FETs (Paperback)
Editore:
Cambridge University Press, Cambridge, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
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Paperback
Da: AussieBookSeller, Truganina, VIC, Australia
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Paperback. Condizione: new. Paperback. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Codice articolo 9780521336178
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Modeling and Characterization of RF and Microwave Power FETs (Paperback)
Editore:
Cambridge University Press, Cambridge, 2011
ISBN 10: 0521336171
ISBN 13: 9780521336178
Nuovo
Paperback
Da: Grand Eagle Retail, Fairfield, OH, U.S.A.
Valutazione del venditore 5 su 5 stelle
Paperback. Condizione: new. Paperback. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Codice articolo 9780521336178
Quantità: 1 disponibili