Fundamentals of Modern VLSI Devices

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9780521832946: Fundamentals of Modern VLSI Devices

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Recensione:

'For the past several years, I've taught from Taur and Ning's book because it's best at connecting advanced device physics to real world device, circuit, and system technology. The second edition updates each chapter, adds new chapters on memory and SOI, doubles the number of appendices, and contains all new homework problems. The best book of its kind is now even better.' Mark Lundstrom, Purdue University

'I have taught a few VLSI device courses with the first edition as a textbook. Those were enjoyable experiences and the book was well received by students. Now the second edition comes with timely updates and two new chapters, which continue the tradition of emphasizing the design aspects of modern VLSI devices. I strongly recommend this book as a text or a reference in semiconductor device courses.' Byung-Gook Park, Seoul National University

'Fundamentals of Modern VLSI Devices, by Taur and Ning, has been an important reference text for our graduate semiconductor device physics course at the University of California, Berkeley for several years. It provides a well-written review of the operation of MOSFETs and BJTs. The new edition expands on this by introducing major new topics related to memories, silicon on insulator devices, and scale length and high field modeling as applied to MOSFETs. By including this material, this text is now positioned to be the primary text for typical graduate device physics courses, and will meet the needs of both students and instructors through its combination of detailed, well-written, and easy to follow descriptions of device operation, coupled with exercises and assignments for testing understanding of the relevant course material.' Vivek Subramanian, University of California, Berkeley

'This second edition of Fundamentals of Modern VLSI Devices builds on the tremendous success enjoyed by the original book. It provides well-organized and in-depth discussions on all relevant aspects of modern MOSFET and BJT devices, with an excellent balance of physics and mathematics. Every chapter is revised to reflect advances in VLSI devices in the last 10 years since the publication of the original book. Two new chapters on memory and silicon-on-insulator devices have been included along with nine additional appendixes. The problems at the end of each chapter are carefully designed and serve to help the readers better understand the key concepts.' Wei Lu, University of Michigan

Descrizione del libro:

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The internationally renowned authors highlight the interdependencies and trade-offs between practically important device parameters and discuss device scaling and scaling limits of CMOS and bipolar devices.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

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Taur, Yuan
Editore: Cambridge University Press (2009)
ISBN 10: 0521832942 ISBN 13: 9780521832946
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Descrizione libro Cambridge University Press, 2009. HRD. Condizione libro: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Codice libro della libreria FM-9780521832946

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Yuan Taur, Tak H. Ning
Editore: CAMBRIDGE UNIVERSITY PRESS, United Kingdom (2009)
ISBN 10: 0521832942 ISBN 13: 9780521832946
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Descrizione libro CAMBRIDGE UNIVERSITY PRESS, United Kingdom, 2009. Hardback. Condizione libro: New. 2nd Revised edition. 249 x 168 mm. Language: English . Brand New Book. Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model, and SiGe-base bipolar devices. Codice libro della libreria AAA9780521832946

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Yuan Taur, Tak H. Ning
Editore: CAMBRIDGE UNIVERSITY PRESS, United Kingdom (2009)
ISBN 10: 0521832942 ISBN 13: 9780521832946
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Descrizione libro CAMBRIDGE UNIVERSITY PRESS, United Kingdom, 2009. Hardback. Condizione libro: New. 2nd Revised edition. 249 x 168 mm. Language: English . Brand New Book. Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model, and SiGe-base bipolar devices. Codice libro della libreria AAA9780521832946

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Yuan Taur, Tak H. Ning
ISBN 10: 0521832942 ISBN 13: 9780521832946
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Descrizione libro Soft cover. Condizione libro: New. Absolutely Brand New Textbook. This is an International Edition Textbook. Fast shipping , 3-5 business days Delivery to US and Canada, 4-6 days delivery to EU and Asia countries via express service. Ship from Multiple Locations, including US, EU, ASIA for inventory purpose. We do not ship to PO/FPO/APO address. Printed in USA with High Quality Paper (not Indian edition due to B/W printing and poor quality paper). Book is printed in English, as the US edition. If US edition printed in color, our book printed in color too! Most international edition has different ISBN and Cover design. Occasionally. international textbooks may come with different exercises at the end of chapters. Some book may show some sales disclaimer word such as "Not for Sale or Restricted in US" on the cover page but it is absolutely legal to use in USA. Codice libro della libreria 12f179780521180245

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YUAN TAUR , TAK H. NING
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Descrizione libro 2009. Hardback. Condizione libro: NEW. 9780521832946 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Codice libro della libreria HTANDREE01227038

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Descrizione libro Cambridge University Press, 2009. Hardcover. Condizione libro: Brand New. 2nd edition. 736 pages. 9.84x6.77x1.42 inches. In Stock. Codice libro della libreria __0521832942

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Descrizione libro Cambridge University Press, 2009. Hardcover. Condizione libro: New. 2. Codice libro della libreria DADAX0521832942

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Tak H. Ning; Yuan Taur
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Descrizione libro Cambridge University Press, 2009. Hardcover. Condizione libro: New. book. Codice libro della libreria 0521832942

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Descrizione libro Cambridge University Press, 2009. Hardcover. Condizione libro: New. Codice libro della libreria P110521832942

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