Circuit layouts, design tips, and measurement techniques for building and testing RF and microwave systems.
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Thomas H. Lee received his Sc.D. from the Massachusetts Institute of Technology and is an Associate Professor of Electrical Engineering at Stanford University. He has been a Distinguished Lecturer of both the IEEE Solid-State Circuits Society and the IEEE Microwave Theory and Techniques Society. He is the winner of four 'best paper' awards at international conferences as well as a Packard Foundation Fellowship winner. He has written 100 technical papers and authored the acclaimed text 'The Design of CMOS Radio-Frequency Integrated Circuits' now published in its second edition by Cambridge University Press. He holds 35 US patents and has co-founded several companies, including Matrix Semiconductor.
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Condizione: New. 2004. Har/Cdr. Hardcover. Circuit layouts, design tips, and measurement techniques for building and testing RF and microwave systems. Num Pages: 882 pages, 45 tables. BIC Classification: TJFN. Category: (P) Professional & Vocational. Dimension: 257 x 179 x 46. Weight in Grams: 1694. . . . . . Codice articolo V9780521835268
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Condizione: New. 2004. Har/Cdr. Hardcover. Circuit layouts, design tips, and measurement techniques for building and testing RF and microwave systems. Num Pages: 882 pages, 45 tables. BIC Classification: TJFN. Category: (P) Professional & Vocational. Dimension: 257 x 179 x 46. Weight in Grams: 1694. . . . . . Books ship from the US and Ireland. Codice articolo V9780521835268
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