Scanning and Transmission Electron Microscopy: An Introduction - Rilegato

Flegler, Stanley L.; Heckman, John W., Jr.; Klomparens, Karen L.

Rilegato

ISBN 10: 0716770474 ISBN 13: 9780716770473

Casa editrice: W H Freeman & Co, 1993

Riassunto

This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens.
Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.

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Informazioni sull'autore

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Dettagli dell'edizione

• Editore: W H Freeman & Co
• Data di pubblicazione: 1993
• Lingua: Inglese
• ISBN 10: 0716770474
• ISBN 13: 9780716770473
• Rilegatura: Copertina rigida
• Numero di pagine: 320
• Contatto del produttore: non disponibile
• Persona responsabile: Ufficio Anagrafiche Messaggerie; ufficio.anagrafiche@meli.it; ; Via Verdi, 8; Assago Milano; 20090; Italia