Scanning and Transmission Electron Microscopy: An Introduction - Rilegato

Flegler, Stanley L.; Heckman, John W., Jr.; Klomparens, Karen L.

 
9780716770473: Scanning and Transmission Electron Microscopy: An Introduction

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This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens.
Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.

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Informazioni sull?autore


Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

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Altre edizioni note dello stesso titolo

9780195107517: Scanning and Transmission Electron Microscopy: An Introduction

Edizione in evidenza

ISBN 10:  0195107519 ISBN 13:  9780195107517
Casa editrice: Oxford Univ Pr on Demand, 1993
Rilegato