X-Ray Optics and Microanalysis: Proceedings of the 20th International Congress: v. 1221 - Rilegato

 
9780735407640: X-Ray Optics and Microanalysis: Proceedings of the 20th International Congress: v. 1221
Rilegato
ISBN 10: 0735407649 ISBN 13: 9780735407640
Casa editrice: American Institute of Physics, 2010

Sinossi

"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Editore
American Institute of Physics
Data di pubblicazione
2010
Lingua
Inglese
ISBN 10 
0735407649
ISBN 13 
9780735407640
Rilegatura
Copertina rigida
Numero di pagine
228
Redattore
Denecke Melissa A., Walker Clive T.
Contatto del produttore
Springer-Verlag GmbH
customerservice@springernature.com

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