Nanoscale Standards by Metrological AFM and Other Instruments - Brossura

Misumi, Ichiko

 
9780750331920: Nanoscale Standards by Metrological AFM and Other Instruments

Sinossi

This book reviews nanometrological standards before proceeding to detail pitch, step height, line width, nanoparticle size, and surface roughness. Essential for users making quantitative nanoscale measurements, in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications.

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9780750331890: Nanoscale Standards by Metrological Afm and Other Instruments

Edizione in evidenza

ISBN 10:  0750331895 ISBN 13:  9780750331890
Casa editrice: Inst of Physics Pub Inc, 2021
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