Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films - Rilegato

Brundle, C. R.; Evans, Charles A., Jr.

Rilegato

ISBN 10: 0750691689 ISBN 13: 9780750691680

Casa editrice: Butterworth-Heinemann, 1992

Riassunto

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

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Contenuti

Imaging Techniques, Elemental, Chemical, and Structural Analysis in Electron Beam Column Instruments, Structure Determination by Electron/X-Ray Diffraction/Scattering, Electron Emission Spectroscopies, X-Ray Absorption and Emission Spectroscopies, Visible/UV Emission nad Reflection, Vibrational Spectroscopies and NMR, Ion Scattering Techniques, Mass Spectroscopy and Optical Techniques, Neutron and Nuclear Techniques, Physical and Magnetic Properties

Dettagli dell?edizione

• Editore: Butterworth-Heinemann
• Data di pubblicazione: 1992
• Lingua: Inglese
• ISBN 10: 0750691689
• ISBN 13: 9780750691680
• Rilegatura: Copertina rigida
• Numero di pagine: 800
• Redattore: Wilson Shaun
• Contatto del produttore: non disponibile