Characterization in Compound Semiconductor Processing - Rilegato

Strausser, Yale

 
9780750692663: Characterization in Compound Semiconductor Processing
Rilegato
ISBN 10: 0750692669 ISBN 13: 9780750692663
Casa editrice: Butterworth-Heinemann, 1994

Sinossi

Characterization in Compound Semiconductor Processing is for scientists and engineers working with compound semiconductor materials and devices who are not characterization specialists. Materials and processes typically used in R&D and in the fabrication of GaAs, GaAlAs, InP and HgCdTe based devices provide examples of common analytical problems. The book discusses a variety of characterization techniques to provide insight into how each individually, or in combination, might be used in solving problems associated with these materials. The book will help in the selection and application of the appropriate analytical techniques by its coverage of all stages of materials or device processing: substrate preparation, epitaxial growth, dielectric film deposition, contact formation and dopant introduction.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Editore
Butterworth-Heinemann
Data di pubblicazione
1994
Lingua
Inglese
ISBN 10 
0750692669
ISBN 13 
9780750692663
Rilegatura
Copertina rigida
Numero di pagine
250
Redattore
McGuire Gary E.
Contatto del produttore
non disponibile
Persona responsabile
non disponibile

Altre edizioni note dello stesso titolo

9781606500415: Characterization in Compound Semiconductor Processing

Edizione in evidenza

ISBN 10:  1606500414 ISBN 13:  9781606500415
Casa editrice: Momentum Press, 2010
Rilegato