Defect Oriented Testing for Cmos Analog and Digital Circuits: v. 10 - Rilegato

Sachdev, Manoj

Rilegato

ISBN 10: 0792380835 ISBN 13: 9780792380832

Casa editrice: Kluwer Academic Pub, 1997

Riassunto

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives. Providing a detailed overview of the subject, this book is intended for design and test professionals as well as researchers and students working in the field.

Su questo libro

Product Description

Kluwer Academic Publishers, Boston, 1998. 308 pages, Paperback - former library book in good condition -

Dettagli dell'edizione

• Editore: Kluwer Academic Pub
• Data di pubblicazione: 1997
• Lingua: Inglese
• ISBN 10: 0792380835
• ISBN 13: 9780792380832
• Rilegatura: Copertina rigida
• Numero di pagine: 308
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania