1992 IEEE International Workshop on Defect and Fault Tolerence in Vlsi Systems/92Th0481-2 - Rilegato

Institute Of Electrical And Electronics Engineers

 
9780818628351: 1992 IEEE International Workshop on Defect and Fault Tolerence in Vlsi Systems/92Th0481-2
Rilegato
ISBN 10: 0818628359 ISBN 13: 9780818628351
Casa editrice: IEEE Computer Society, 1993

Sinossi

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.

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Editore
IEEE Computer Society
Data di pubblicazione
1993
Lingua
Inglese
ISBN 10 
0818628359
ISBN 13 
9780818628351
Rilegatura
Copertina rigida
Numero di pagine
352
Contatto del produttore
non disponibile
Persona responsabile
non disponibile