The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems - Rilegato

International Workshop On Defect And Fault Tolerance In VLSI Systems (1994 : Montreal, Quebec)

Rilegato

ISBN 10: 0818663073 ISBN 13: 9780818663079

Casa editrice: IEEE, 1994

Riassunto

Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright Book News, Inc. Portland, Or.

Dettagli dell'edizione

• Editore: IEEE
• Data di pubblicazione: 1994
• Lingua: Inglese
• ISBN 10: 0818663073
• ISBN 13: 9780818663079
• Rilegatura: Copertina rigida
• Numero di pagine: 299
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile