The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana - Rilegato

IEEE International Symposium On Defect And Fault Tolerance In VLSI Systems

 
9780818671074: The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana
Rilegato
ISBN 10: 0818671076 ISBN 13: 9780818671074
Casa editrice: IEEE Computer Society, 1995

Sinossi

An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright Book News, Inc. Portland, Or.

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Editore
IEEE Computer Society
Data di pubblicazione
1995
Lingua
Inglese
ISBN 10 
0818671076
ISBN 13 
9780818671074
Rilegatura
Copertina rigida
Numero di pagine
305
Contatto del produttore
non disponibile
Persona responsabile
non disponibile