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Records of the 1996 IEEE International Workshop on Memory Technology, Design and Testing: August 13-14, 1996, Singapore - Brossura
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The keynote speech on future trends in flash memories is followed by 16 additional review and research papers. Among the topics are built-in self-testing for detecting of coupling faults in semiconductor memories, a low-power current sensing scheme for CMOS SRAM, scanning capacitance microscopy analysis of DRAM trench capacitors, the thermal monitoring of memories, and a true testprocessor-per-pin algorithmic pattern generator. No subject index. Annotation c. by Book News, Inc., Portland, Or.
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Records of the 1996 IEEE International Workshop on Memory Technology, Design and Testing: August 13-14, 1996, Singapore
Editore:
IEEE Computer Society, 1996
ISBN 10: 0818674660
ISBN 13: 9780818674662
Antico o usato
Brossura
Da: Bulrushed Books, Moscow, ID, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: Acceptable. SHIPS FAST. RESCUED + REPAIRED. Features a small coffee mishap, plus a reinforced binding, secured cover, and light annotations or highlighting-a durable, fully readable working copy brought back to life at a great value by our Book Sustainability Project. No access codes or CDs. Codice articolo #69A-00168
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EUR 46,02
Spedizione EUR 7,72
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