Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.
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Waves; deffraction; phase evaluation methods; detectors and recording materials; holographic interferometry; speckle metrology; photoelasticity; the Moire phenomenon
Book by Sirohi Rajpal S
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