Growth and Characterisation of Semiconductors - Brossura

Brossura

ISBN 10: 0852741316 ISBN 13: 9780852741313

Casa editrice: CRC Press, 1990

Riassunto

This book explains and evaluates methods used to grow and characterise low-dimensional semiconductor structures. It is based on course material developed in association with the London University Interdisciplinary Research Centre for Semiconductor Materials. It is written for graduates in physics, materials science and electrical engineering working in the research and development of semiconductors.

Su questo libro

Contenuti

The basics of epitaxy (D W Pashley). Metal organic chemical vapour deposition (MOCVD) for the preparation of semiconductor materials and devices (J O Williams). Growth of thin films and heterostructures of III-V compounds by molecular beam epitaxy (C T Foxon and B A Joyce). Scanning electron microscopy (SEM) microcharacterisation of semiconducting materials and devices (D B Holt). Depth profiling of semiconductor materials by secondary ion mass spectrometry (J B Clegg). Localised vibrational mode spectroscopy of impurities in semiconductor crystals (R C Newman). Point defect studies using electron paramagnetic resonance (R C Newman). Photoluminescence characterisation (E C Lightowlers). Hall, magnetoresistance and infrared conductivity measurements (R A Stradling). Characterisation of semiconductors by capacitance methods (D W Palmer). High resolution electron microscopy of semiconductors (J L Hutchison).

Dettagli dell'edizione

• Editore: CRC Press
• Data di pubblicazione: 1990
• Lingua: Inglese
• ISBN 10: 0852741316
• ISBN 13: 9780852741313
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 252
• Redattore: Stradling R.A, Klipstein P.C
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile