High-Level Test Synthesis of Digital Vlsi Circuits - Rilegato

Lee, Mike Tien-Chien

 
9780890069073: High-Level Test Synthesis of Digital Vlsi Circuits

Sinossi

Reports research promoting a better design approach to testing integrated circuits based on high-level test synthesis, which is able to explore the synthesis freedom provided at a high level to derive an inherently testable architecture at low or even no overhead. Presents several effective schemes for highly testable digital circuits, assuming a non-scan or partial-scan test strategy. These schemes are implemented in the Princeton HI- level Test Synthesis system, which is also presented. Based on a Ph. D. dissertation for Princeton. Double spaced. Annotation c. by Book News, Inc., Portland, Or.

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Book by Lee Mike TienChien

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