Uncertainty Quantification of Stochastic Defects in Materials - Brossura

Chu, Liu

Brossura

ISBN 10: 1032128755 ISBN 13: 9781032128757

Casa editrice: CRC Press, 2024

Riassunto

Uncertainty Quantification of Stochastic Defects in Materials investigates the uncertainty quantification methods for stochastic defects in material microstructures. It provides effective supplementary approaches for conventional experimental observation with the consideration of stochastic factors and uncertainty propagation. Pursuing a comprehensive numerical analytical system, this book establishes a fundamental framework for this topic, while emphasizing the importance of stochastic and uncertainty quantification analysis and the significant influence of microstructure defects on the material macro properties.

Key Features

• Consists of two parts: one exploring methods and theories and the other detailing related examples
• Defines stochastic defects in materials and presents the uncertainty quantification for defect location, size, geometrical configuration, and instability
• Introduces general Monte Carlo methods, polynomial chaos expansion, stochastic finite element methods, and machine learning methods
• Provides a variety of examples to support the introduced methods and theories
• Applicable to MATLAB® and ANSYS software

This book is intended for advanced students interested in material defect quantification methods and material reliability assessment, researchers investigating artificial material microstructure optimization, and engineers working on defect influence analysis and nondestructive defect testing.

Su questo libro

Informazioni sull'autore

Dr. Liu Chu received her B.E. degree in Materials Science and Engineering, and M.E. degree in Mechanics from Dalian Maritime University, China, and the Ph.D. in Mechanics from the Institut national des sciences appliquées de Rouen (INSA Rouen), France. Dr. Chu focuses on research in computational material mechanics and structural reliability. Her recent research interests include low-dimensional nanomaterial vacancy defects quantification, artificial material microstructure optimization, and mechanical structure reliability analysis. Since 2018, Dr. Chu has published 18 peer-reviewed science and technical papers in international journals and conferences. She is a member of IEEE and has served as a reviewer of several international journals.

Dalla quarta di copertina

Pursuing a comprehensive numerical analytical system, the book establishes a fundamental framework for this topic, while emphasizing the importance of stochastic and uncertainty quantification analysis and the significant influence of microstructure defects in the material macro properties.

Dettagli dell'edizione

• Editore: CRC Press
• Data di pubblicazione: 2024
• Lingua: Inglese
• ISBN 10: 1032128755
• ISBN 13: 9781032128757
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 196
• Contatto del produttore: Taylor and Francis, GPSR Taylor and Francis; gpsr@taylorandfrancis.com; ; Taylor & Francis Verlag GmbH, Kaufingerstraße 24; München; 80331; Germania