Articoli correlati a Advanced Materials Characterization: Basic Principles,...

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Rilegato

Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram

 
9781032375106: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Rilegato
ISBN 10: 1032375108 ISBN 13: 9781032375106
Casa editrice: CRC Press, 2023

Sinossi

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

  • Covers material characterization techniques and the development of advanced characterization technology
  • Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
  • Discusses advanced material characterization technology in the microstructural and property characterization fields
  • Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
  • Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sull'autore

Ch Sateesh Kumar

Dalla quarta di copertina

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
CRC Press
Data di pubblicazione
2023
Lingua
Inglese
ISBN 10 
1032375108
ISBN 13 
9781032375106
Rilegatura
Copertina rigida
Numero edizione
1
Numero di pagine
130
Contatto del produttore
Taylor and Francis, GPSR Taylor and Francis
gpsr@taylorandfrancis.com

Taylor & Francis Verlag GmbH, Kaufingerstraße 24
München
80331
Germania