Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Brossura

Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram

Brossura

ISBN 10: 1032375116 ISBN 13: 9781032375113

Casa editrice: CRC Press, 2024

Riassunto

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

• Covers material characterization techniques and the development of advanced characterization technology
• Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
• Discusses advanced material characterization technology in the microstructural and property characterization fields
• Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
• Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Dettagli dell'edizione

• Editore: CRC Press
• Data di pubblicazione: 2024
• Lingua: Inglese
• ISBN 10: 1032375116
• ISBN 13: 9781032375113
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 130
• Contatto del produttore: Taylor and Francis, GPSR Taylor and Francis; gpsr@taylorandfrancis.com; ; Taylor & Francis Verlag GmbH, Kaufingerstraße 24; München; 80331; Germania