Articoli correlati a Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics - Rilegato

Libro 15 di 20: Cambridge RF and Microwave Engineering

Wallis, T. Mitch; Kabos, Pavel

 
9781107120686: Measurement Techniques for Radio Frequency Nanoelectronics
Rilegato
ISBN 10: 1107120683 ISBN 13: 9781107120686
Casa editrice: Cambridge University Press, 2017

Sinossi

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sugli autori

T. Mitch Wallis is a physicist in the Applied Physics Division at the National Institute of Standards and Technology, Boulder, Colorado. He is also the Chair of the Institute of Electrical and Electronics Engineers (IEEE) Microwave Theory and Techniques Society's Technical Committee on Radio Frequency Nanotechnology.

Pavel Kabos is a physicist in the Applied Physics Division at the National Institute of Standards and Technology. He is the author of Magnetostatic Waves and Their Applications (1993) and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE).

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Cambridge University Press
Data di pubblicazione
2017
Lingua
Inglese
ISBN 10 
1107120683
ISBN 13 
9781107120686
Rilegatura
Copertina rigida
Numero di pagine
328
Contatto del produttore
non disponibile
Persona responsabile
Avery
https://www.avery.fr/

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