A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of Reflection Coefficients From Thin Films (Classic Reprint) - Brossura
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Excerpt from A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of Reflection Coefficients From Thin Films
A Fortran computer program to calculate the reflection coefficients for both single and multiple thin films and to analyze Optical measurements of such films by an ellipsometer is presented. Both the films and the substrate may be absorbing and have complex indexes of refraction. The reflection coefficients of inhomogeneous films (films of varying refractive index) may be computed by determining the reflection coefficients of an equivalent series of homogeneous films.
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A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of
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Paperback. Condizione: New. Print on Demand. This book presents a detailed guide to the use of a FORTRAN computer program for the analysis of ellipsometer measurements and the calculation of reflection coefficients from thin films. The program can be used to determine the optical constants of thin films, including the refractive index and thickness, as well as the complex reflection coefficients for both single and multiple thin films. The book includes a detailed description of the program, including the input and output formats, and provides examples of how to use the program to perform various types of calculations. It also includes a discussion of the theory of ellipsometry and the optical properties of thin films. The book is a valuable resource for scientists and engineers who work with thin films and ellipsometry. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Codice articolo 9781390449723_0
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