A Designers Guide to Built-In Self-Test: 19 - Rilegato
Libro 8 di 36: Frontiers in Electronic Testing
Sinossi
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
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Contenuti
Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.
Product Description
Book by Stroud Charles E
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer s perspective and describes the major BIST approaches that have been proposed and implemented, a. Codice articolo 4094802
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Buch. Condizione: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Buch | xx | Englisch | 2002 | Springer US | EAN 9781402070501 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Codice articolo 103202853
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