Articoli correlati a High Performance Memory Testing: Design Principles,...
Sinossi
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Recensione
From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)
Contenuti
Preface. Section I: Design & Test of Memories. 1. Opening Pandora's Box. 2. Static Random Access Memories. 3. Multi-Port Memories. 4. Silicon On Insulator Memories. 5. Content Addressable Memories. 6. Dynamic Random Access Memories. 7. Non-Volatile Memories. Testing II: Memory Testing. 8. Memory Faults. 9. Memory Patterns. Section III: Memory Self Test. 10. BIST Concepts. 11. State Machine BIST. 12. Micro-Code BIST. 13. BIST and Redundancy. 14. Design For Test and BIST. 15. Conclusions. Appendices. Appendix A. Further Memory Fault Modeling. Appendix B. Further Memory Test Patterns. Appendix C. State Machine HDL. References. Glossary/Acronyms. Index. About the Author.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
- EditoreKluwer Academic Pub
- Data di pubblicazione2002
- ISBN 10 1402072554
- ISBN 13 9781402072550
- RilegaturaCopertina rigida
- LinguaInglese
- Numero di pagine264
- Contatto del produttorenon disponibile
Compra nuovo
Visualizza questo articolo
EUR 117,20
EUR 26,33 per la spedizione da U.S.A. a Italia
Destinazione, tempi e costi
Risultati della ricerca per High Performance Memory Testing: Design Principles,...
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Da: Books From California, Simi Valley, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
hardcover. Condizione: Good. minor wear and creasing. Codice articolo mon0003466043
Quantità: 1 disponibili
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Da: HPB-Emerald, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority! Codice articolo S_409199676
Quantità: 1 disponibili
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Da: Toscana Books, AUSTIN, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Codice articolo Scanned1402072554
Quantità: 1 disponibili
Immagini fornite dal venditore
High Performance Memory Testing
Print on DemandDa: moluna, Greven, Germania
Valutazione del venditore 5 su 5 stelle
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were. Codice articolo 4094950
Quantità: Più di 20 disponibili
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
Da: SatelliteBooks, Burlington, VT, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: New. Hardcover, /no DJunused, minor shelf-wearFree of any markings and no writing. For Additional Information or pictures, Please Inquire. Codice articolo SKU002924
Quantità: 1 disponibili
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Da: BennettBooksLtd, North Las Vegas, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: New. In shrink wrap. Looks like an interesting title! Codice articolo Q-1402072554
Quantità: 1 disponibili
Immagini fornite dal venditore
High Performance Memory Testing
Print on DemandDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 266 pp. Englisch. Codice articolo 9781402072550
Quantità: 2 disponibili
Immagini fornite dal venditore
High Performance Memory Testing
Editore:
Springer US, Springer US Sep 2002, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
Nuovo
Rilegato
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch. Codice articolo 9781402072550
Quantità: 2 disponibili
Foto dell'editore
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
Condizione: New. In. Codice articolo ria9781402072550_new
Quantità: Più di 20 disponibili
Immagini fornite dal venditore
High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
Da: AHA-BUCH GmbH, Einbeck, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Codice articolo 9781402072550
Quantità: 1 disponibili