Legacy Data: A Structured Methodology for Device Migration in DSM Technology - Brossura

Chatterjee, Pallab

Brossura

ISBN 10: 1461349826 ISBN 13: 9781461349822

Casa editrice: Springer, 2012

Riassunto

Legacy Data: A Structured Methodology For Device Migration in DSM Technology deals with the migration of existing hard IP from one technology to another using repeatable procedures. The challenge of hard IP migration is not simply an EDA problem but rather a client application specification problem. It requires a deep understanding of the process technologies, EDA tools (and their interfaces) and target applications.
Legacy Data: A Structured Methodology For Device Migration in DSM Technology is unique in that there are currently no reference books focused on legacy data reuse, especially for hard IP. This book will allow CAD practitioners to quickly develop methodologies that capitalize on the large volumes of legacy data available within a company today. It details the issues of developing a structured methodology, building verification test benches, and validating the final physical design.

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Contenuti

Foreword. Acknowledgements. Glossary. 1. Introduction. 2. Legacy Data. 2.1. Modem SOC Flow. 2.2. Legacy Data Review. 3. Reasons for Data Migration. 3.1. Functional Reuse in Derivative Products. 4. New Rules for DSM Flows. 4.1. Device Geometries. 4.2. Wafer Type. 4.3. Isolation Technique. 4.4. Operating Voltage. 4.5. Process Design Rules. 4.6. Device Performance. 4.7. Interconnect Options. 4.8. Memory Techniques. 4.9. OPC Masking Techniques. 5. Structured Methodology. 5.1. Assumptions for Migration. 5.2. Flowchart of Methodology. 5.3. Sequence of the Methodology. 6. Screening Criteria for Blocks. 6.1. Introduction of Case Study. 6.2. Block Selection. 6.3. Description of Selection Criteria. 7. Process Compatibility. 7.1.Process Migration Tradeoffs. 7.2. Sample USB Block Tradeoff Analysis. 8. Test Bench Requirements. 8.1. Test Bench Minimum Requirements. 8.2. Digital Test Bench. 8.3. Device Level Test Bench. 8.4. USB Sample Summary. 9. Block Identification. 9.1. Physical and Design Views. 9.2. Multiple View Correction. 9.3. Hierarchy Tree. 9.4. Test Circuits, Clocks and Power Grids. 10. Design Retargeting. 10.1 Device Level ReDesign Stages. 10.2. Re-Engineering Process: Device Level Design. 10.3. Re-Engineering Process: Corner Based Design. 10.4. Summary for USB BlockMigration. 11. Design Validation. 11.1. Types of Validation. 11.2. Case Study Validation Summary. 12. Physical Design Migration. 12.1. Physical Migration Options. 13. Post Layout Validation. 13.1 Design Rule Checking: DRC. 13.2 Layout vs. Schematic: LVS. 13.3. Power Analysis: IR Drop. 13.4. Noise Analysis and Coupling: Signal Integrity. 13.5. RC Extraction for STA and for Device Stimulation. 13.6. Case Study Summary for Physical Verification. 14. Full Chip Verification. 14.1 Abstracts Required. Bibliography. Index.

Product Description

Book by Chatterjee Pallab

Dettagli dell'edizione

• Editore: Springer
• Data di pubblicazione: 2012
• Lingua: Inglese
• ISBN 10: 1461349826
• ISBN 13: 9781461349822
• Rilegatura: Copertina flessibile
• Numero di pagine: 152
• Contatto del produttore: GPSR Kontakt; ProductSafety@springernature.com; ; Tiergartenstr. 17; Heidelberg; 69121; Germania