Sinossi
Analysis and Design of MOSFETs: Modeling, Simulation, and Parameter Extraction is the first book devoted entirely to a broad spectrum of analysis and design issues related to the semiconductor device called metal-oxide semiconductor field-effect transistor (MOSFET). These issues include MOSFET device physics, modeling, numerical simulation, and parameter extraction. The discussion of the application of device simulation to the extraction of MOSFET parameters, such as the threshold voltage, effective channel lengths, and series resistances, is of particular interest to all readers and provides a valuable learning and reference tool for students, researchers and engineers.
Analysis and Design of MOSFETs: Modeling, Simulation, and Parameter Extraction, extensively referenced, and containing more than 180 illustrations, is an innovative and integral new book on MOSFETs design technology.
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Contenuti
Preface. 1. MOSFET Physics and Modeling. 2. MOSFET Simulation Using Device Simulator. 3. Extraction of the Threshold Voltage of MOSFETs. 4. Methods for Extracting the Effective Channel Length of MOSFETs. 5. Extraction of the Drain and Source Series Resistances of MOSFETs. 6. Parameter Extraction of Lightly-Doped Drain (LDD) MOSFETs. Appendices. A. Physical Constants and Unit Conversions. B. Properties of Germanium, Silicon, and Gallium Arsenide (at 300 K). C. Properties of SiO2 and Si3N4 (at 300 K). D. Derivation of the Integral Function and its Applications to Parameter Extraction. Subject Index. About the Authors.
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Analysis and Design of MOSFETs: Modeling, Simulation, and Parameter Extraction is the first book devoted entirely to a broad spectrum of analysis and design issues related to the semiconductor device called metal-oxide semiconductor fie. Codice articolo 4195610
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Taschenbuch. Condizione: Neu. Analysis and Design of MOSFETs | Modeling, Simulation, and Parameter Extraction | Juin Jei Liou (u. a.) | Taschenbuch | xiv | Englisch | 2012 | Springer | EAN 9781461374732 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Codice articolo 105649067
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Analysis and Design of MOSFETs: Modeling, Simulation, and Parameter Extraction is the first book devoted entirely to a broad spectrum of analysis and design issues related to the semiconductor device called metal-oxide semiconductor field-effect transistor (MOSFET). These issues include MOSFET device physics, modeling, numerical simulation, and parameter extraction. The discussion of the application of device simulation to the extraction of MOSFET parameters, such as the threshold voltage, effective channel lengths, and series resistances, is of particular interest to all readers and provides a valuable learning and reference tool for students, researchers and engineers.Analysis and Design of MOSFETs: Modeling, Simulation, and Parameter Extraction, extensively referenced, and containing more than 180 illustrations, is an innovative and integral new book on MOSFETs design technology.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 368 pp. Englisch. Codice articolo 9781461374732
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