This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.
Introduction.- Fast PTV Verification and Design.- Pictoral Primer on Probablilities.- 3-Sigma Verification and Design.- High-Sigma Verification and Design.- Variation-Aware Design.- Conclusion.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
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Hardcover. Condizione: Very Good. Springer, 2013. Book has a gift inscription to front endpage, a slight split in binding between front endpage and title page, light rubbing to covers with faint smudges to outer top corner areas. otherwise in great condition, tight binding, bright and unmarked pages; some light cosmetic wear but an overall sturdy, attractive copy with clean interiors. Codice articolo 1006589
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers. 204 pp. Englisch. Codice articolo 9781461422686
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Da: moluna, Greven, Germania
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Documents the state-of-the-art in industrial-scale, variation-aware, custom integrated circuit design Describes the capabilities and benefits of modern Variation-Aware tools and shows how to benchmark such tools during evaluationsDiscusses . Codice articolo 4197388
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