Advances in X-Ray Analysis: Volume 12: Proceedings of the Seventeenth Annual Conference on Applications of X-ray Analysis Held August 21–23, 1968 - Brossura

Barrett, Charles S.

Brossura

ISBN 10: 1468475371 ISBN 13: 9781468475371

Casa editrice: Springer US, 1969

Riassunto

The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and new methods of great power are being developed. These developments are occurring in each of the fields covered, as may readily be seen by a glance at this twelfth volume and other recent volumes of this series. It seems clear that the policy of having these conferences and these volumes cover a wide field rather than a single one such as, for example, structure determination, or fluorescence analysis, is a policy that meets with general approval and should be continued. I understand there is every intention to do so. C. S. Barrett It is customary to acknowledge in each volume the invited session chairmen of the three-day meeting. They and the sessions at which they presided (21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND DIFFRACTION. C. S. Barrett, University of Chicago, Chicago, Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen, Massachusetts Institute of Technology, Cambridge, Massachusetts.

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Contenuti

Close-Packed Ordered Structures.- Crystal Chemistry of Rapidly Quenched (Splat Cooled) Metastable Alloy Phases.- Diffraction Analysis of Structural Disorder in Alloys.- Proton Scattering from Single Crystals.- Determination of Particle Size Distribution in a Dispersion Hardened Nickel Alloy Using Small Angle X-Ray Scattering.- A Study of G.P. Zone Growth Kinetics Through the Use of X-Ray Small Angle Scattering.- Changes in the Bragg-Williams Parameter with Deformation in Ordered Au4V.- Antiphase Domains in Long-Period Superlattices.- A Dynamical Theory Approach to the Berg-Barrett Technique.- Observation of Dislocations in Alpha-Arsenic Single Crystals by X Ray Diffraction Topography.- Instantaneous Display of X-Ray Diffraction Using a Diode Array Camera Tube.- Kossel Line Micro-Diffraction Study of Precipitation of Alpha from Beta in Copper-Zinc Alloys.- A High-Precision Kossel Camera for Research and Routine Analytical Use.- A New Method for Rourier Analysis of Shapes of X-Ray Peaks and Its Application to Line broadening and Integrated Intensity.- X-Ray Analysis of Fatigue Softening in Cold Water Copper.- Observation of the Distinct X-Ray Intensity Peaks Due to a Stacking Fault Structure in Plastically Deformed Alpha-Brass.- A General Computer Program for Particte Size and Strain Analysis.- X-Ray Diffraction Study of the Effects of Uniaxial Plastic Deformation on Residual Stress Measurements.- Role of Residual Stresses as Determined by X-Ray Diffractometry on Magnetic Properties of 4–79 Molybdenum Permalloys.- X-Ray Studies of Plastically Deformed Silver Alloys — Effects Due to Oxygen, Hydrogen, and Tin Solutes.- An X-Ray Line Shape Study of HO 9-4-45 Bainites and Martensites.- Precise Cell Parameters of Semiconductor Crystals and Their Applications.- Direct Determination of the Reciprocal Lattice Spacing and the Radial Interference Distribution by the Fourier Method.- Deformation Textures of Ordered and Disordered Cu3Au.- Direct Printout of X-Ray Pole Figures from Digital Computers.- A Computer-Controlled X-Ray Diffractometer for Texture Studies of Polycrystalline Materials.- Homogeneity Characterization of NBS Spectrometric Standards IV: W-20% MO Prepared by Powder Metallurgical Methods.- Solution Absorptiometry with Beta Excited Sources by Means of Balanced Filters.- Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays.- Measurement of Thin Oxide Surface Film Thicknesses and Atomic Densities by the Analysis of Positive Ion Excited Soft X-Ray Spectra.- Some Recent Work in Low Energy X-Ray and Electron Analysis.- A Total Reflection X-Ray Spectrograph for Fluorescence Analysis of Light Elements.- X-Ray Spectroscopic Studies of Bonding in Iron Germanides.- Simple Two Crystal Spectrometer and its Application to X-Ray Spectrochemical Analysis.- A Correction Method for Elemental Interactions and Physical Effects in the X-Ray Fluorescence Analysis of Silicate Powders.- A Rapid and Accurate X-Ray Determination of the Rare Earths Elements in Solid or Liquid Materials Using the Double Dilution Method.- Quantitative Microanalysis of Refractory Metal Carbide.- Solid Solutions of Cadmium Sulfide-Cadmium Selenide Films: Preparation and Determination by X-Ray Fluorescence Method.- Determination of Argon in RF-Sputtered SiO2 Through X-Ray Emission.- Particle Size Effects in Radioisotope X-Ray Analysis of Powdered Solids and Slurries.- Author Index.

Dettagli dell?edizione

• Editore: Springer US
• Data di pubblicazione: 1969
• Lingua: Inglese
• ISBN 10: 1468475371
• ISBN 13: 9781468475371
• Rilegatura: Copertina flessibile
• Numero di pagine: 664
• Contatto del produttore: non disponibile