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Smart card transaction times will increase as the number of bits used in the algorithms protecting the cards to ensure security increases. This is a potential problem for the Department of Defense, which requires smart card usage for its employees. This book defines, compares, and contrasts two algorithms: Rivest-Shamir-Adleman (RSA) and Elliptic Curve Cryptography (ECC), and then provides test data for encryption algorithms tested on particular certification key processes in an attempt to show that the ECC encryption algorithm provides the security necessary for smart card operations at a fast enough speed to benefit smart card users. It describes the Open Protocol for Access Control Identification and Ticketing with privacy (OPACITY) pilot project that took place over 2014 in relation to the card testing, and hypothesizes the risks and mitigation factors for the Department of Defense to permanently switch to the ECC algorithm for smart card use.
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Time Delay Measurements of Key Generation Process on Smart Cards
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CreateSpace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
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Da: California Books, Miami, FL, U.S.A.
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Time Delay Measurements of Key Generation Process on Smart Cards
Editore:
Createspace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
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Paperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 118. Codice articolo C9781522955399
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Time Delay Measurements of Key Generation Process on Smart Cards (Paperback)
Editore:
Createspace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
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Da: CitiRetail, Stevenage, Regno Unito
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Paperback. Condizione: new. Paperback. Smart card transaction times will increase as the number of bits used in the algorithms protecting the cards to ensure security increases. This is a potential problem for the Department of Defense, which requires smart card usage for its employees. This book defines, compares, and contrasts two algorithms: Rivest-Shamir-Adleman (RSA) and Elliptic Curve Cryptography (ECC), and then provides test data for encryption algorithms tested on particular certification key processes in an attempt to show that the ECC encryption algorithm provides the security necessary for smart card operations at a fast enough speed to benefit smart card users. It describes the Open Protocol for Access Control Identification and Ticketing with privacy (OPACITY) pilot project that took place over 2014 in relation to the card testing, and hypothesizes the risks and mitigation factors for the Department of Defense to permanently switch to the ECC algorithm for smart card use. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Codice articolo 9781522955399
Quantità: 1 disponibili
Foto dell'editore
Time Delay Measurements of Key Generation Process on Smart Cards
Editore:
CreateSpace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
Nuovo
Brossura
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Codice articolo ABLIING23Mar2716030310529
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